Surface Analysis Laboratory

Surface analysis techniques can be used to solve problems in a huge range of areas, some of which are listed below.

• Adhesive failure analysis/delamination
• Identification of surface contamination
• Assessment of cleaning procedures
• Elemental composition – bulk and surface
• Chemical state information
• Material identification and verification
• Micro or nano particle analysis
• Thin film analysis
• Metal passivation and corrosion
• Grain boundary segregation in metals
• Surface segregation
• Protective coatings and paints
• Identification of stains and discolorations
• Polymer surface functionality before and after various treatments
• Oxide film thickness
• Surface ultra-thin film thickness
• Depth profiles of thin film components
• Defect identification
• Molecular identification of lubricants, additives, and contaminants
• Catalysis

Are the techniques destructive?

Both X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) are considered non-destructive techniques. Sample damage may occur on those sensitive to the high energy x-rays or electron beam.

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) removes the outer few nanometers of material for analysis but is considered non-destructive for most samples.

If depth profiles are desired, argon or other ion etching is employed; this leads to the removal of several hundred nanometers of material.

Minimum detectable concentration of an element

The minimum detectable concentration of most elements in both X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) is 0.1at. per cent although heavy elements can be detected at lower levels. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) provides a level of detection in the ppm region.

As each problem is unique our fees will vary depending upon:

• The analysis techniques required
• The level of analysis or information required
• The difficulty of sample preparation
• Sample type and sample number

So we can't give specific quotes until we have discussed your needs. However an initial discussion with our Laboratory Manager will be free of charge.

Discounts

For those companies that are sponsoring MSc or PhD students or our Engineering Doctorate researchers, discounts are given on the cost of analysis. For significant analysis requiring several days of instrument time a discount may also be applicable.

Examples

An example of a variation in costs would be, the analysis of metallic samples in XPS where a surface composition is only required without any chemical state information can be completed faster and more easily than the analysis of insulators where chemical state information is desired.

Another example with varying costs is analysis in our Auger microscope, the elemental composition of a nanoparticle can be obtained far faster than the composition of a fracture interface fractured in vacuo.

Initial discussion

You are welcome to visit the Laboratory and discuss your requirements in person, or you can send our Laboratory Manager, Dr Steven Hinder an email.

The laboratory staff will always be clear about our capability, facilities, analysis timescale and the results you can expect from the analysis.

Detailed quote is given

If it is decided to go ahead with an investigation a description of the proposed work and a detailed quote will be sent to you for approval.

Collecting and sending your samples

As the surface of samples is so easily contaminated, please, while wearing gloves, wrap the samples securely in fresh aluminium foil and then place in ziplock sample bags. Samples should be clearly labelled individually with a number or other reference if they are sent in a batch.

Our maximum sample size is determined by the size of the vacuum gate valves in our equipment. For XPS and SIMS this is 5x5x2cm and for AES this is 3x3x2cm. A wide range of sample preparation can be carried out on site to ensure a sample is a suitable size for analysis.

You can bring the samples here to the Laboratory in person, or send them to us by post at:

Surface Analysis Laboratory

University of Surrey

Guildford

Surrey

GU2 7XH

The analysis

Typically analysis is completed within one to two weeks from when the sample is received. However if the results are needed urgently then a rush can be achieved and analysis is completed in a few days.

Receiving your data

Once the analysis is complete the data that is collected is considered to be your property and is confidential. A copy will be sent to you and the original files can either be archived for up to two years or deleted at your request. Your samples can be returned should you require them.